As a DFT Engineer , you will be responsible for defining, architecting,

and executing robust Design-for-Test strategies for high-performance SoCs/ASICs. You will

work closely with front-end design, physical design, verification, and product engineering teams

to ensure high test coverage, optimal silicon quality, and streamlined post-silicon

manufacturing test enablement.

Key Responsibilities

● Pre-Silicon Execution:

○ Define and implement comprehensive DFT architectures including Scan, ATPG, MBIST,

and JTAG / IEEE standards (1149.1, 1500, 1687 IJTAG).

○ Perform Scan Chain Insertion, stitching, and optimization to ensure timing closure and

power grid compatibility.

○ Integrate Memory BIST (MBIST) controllers, repair mechanisms, and custom memory

test routines.

○ Generate high-coverage Automatic Test Pattern Generation (ATPG) patterns, including

Stuck-at, At-Speed (Transition/Path Delay), and Cell-Aware testing.

○ Execute Verilog/SystemVerilog simulations for gate-level DFT validation, ensuring timing

and vector cleanliness (SDF simulation).

○ Run DFT linting and rule checking using industry-standard tools (e.g., SpyGlass DFT,

Tessent, Modus, or TetraMAX)

● Post-Silicon Production & Bring-up:

○ Translate pre-silicon ATPG and MBIST patterns into tester formats (e.g., WGL, STIL) for

ATE (Automatic Test Equipment) deployment.

○ Support post-silicon bring-up in the lab, debugging first-silicon DFT features, pattern

conversion, and silicon failures.

○ Collaborate with Product and Test Engineering (PTE) teams to optimize test time,

diagnose failure modes, and boost manufacturing yield.

Required Qualifications

● Experience: 3+ years of hands-on DFT experience in advanced SoC/ASIC development

nodes.

● Core Skills & Technical Expertise:

○ Verilog / SystemVerilog: Strong proficiency in Hardware Description Languages for DFT

integration, wrapper creation, and simulation debugging.

○ Scan Insertion: Hands-on experience with scan synthesis, compressed scan

architectures (EDT/SmartTest), and boundary scan integration.

○ ATPG: Deep experience generating, debugging, and fault-grading Stuck-at, At-speed, andfault-model test patterns.

○ MBIST: Proven experience with memory BIST insertion, MBIST architecture, and memory

repair schemes.

○ JTAG: Solid understanding of IEEE 1149.1 standards, TAP controllers, and board/chip-level test logic integration.

○ Post-Silicon Support: Direct experience bringing up patterns on target silicon and

supporting production yield ramp.

Preferred Skills

● Familiarity with scripting languages (Tcl, Python, or Perl) for automation of DFT flows.

● Knowledge of advanced DFT concepts like High-Speed IO testing, SerDes loopback, or

Analog DFT.

● Understanding of synthesis tools (Synopsys Design Compiler, Cadence Genus) and static

timing analysis (STA) constraint creation for DFT modes

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